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IEC 62368-1 Figure V.3 Test Finger Probe Telecom Test Probe With IEC60950 Figure 2C

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IEC 62368-1 Figure V.3 Test Finger Probe Telecom Test Probe With IEC60950 Figure 2C

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Brand Name : HongCe

Model Number : HT-I23

Certification : Third part calibration certificate(cost additional)

Place of Origin : China

MOQ : 1 set

Price : Negotiatable

Payment Terms : T/T

Supply Ability : 100 set/ month

Delivery Time : 3 Days

Packaging Details : Aluminum Box

Product name : Telecom Test Probe

Warranty : 1 Year

Usage : bare parts of TNV circuits of information technology equipment test

Material : Nylon handle + stainless steel probe

Application : Information technology equipment test

Standards : IEC 62368-1, IEC 60950 and etc.

Probe length : 80

End radius : R6

Probe diameter : Φ12

Baffle diameter of the handle : 50

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IEC 62368-1 Figure V.3 Test Finger Probe Telecom Test Probe With IEC60950 Figure 2C

Standard description(IEC 62151 4.2.2.1):

4.2.2.1 Accessibility
The equipment shall be so constructed that in USER ACCESS AREAS there is adequate protection against contact with bare parts of TNV - 1 , TNV - 2 and
TNV - 3 CIRCUITS except that access is permitted to: Test Finger Probe
– contacts of connectors which cannot be touched by the test probe (figure 3);
– bare conductive parts in the interior of a battery compartment that complies with 4.2.2.2;
– bare conductive parts of TNV - 1
CIRCUITS that are connected to a PROTECTIVE EARTHING terminal;
In SERVICE ACCESS AREAS , no requirement is specified regarding access to TNV - 1 , TNV - 2 or TNV - 3 CIRCUITS , however HAZARDOUS - LIVE - PARTS shall be located or guarded so that unintentional bridging by conductive materials that might be present is unlikely. Test Finger Probe
Any guards required for compliance with 4.2.2.1 shall be easily removable and replaceable if removal is necessary for service.
In RESTRICTED ACCESS LOCATIONS no requirement is specified egarding access to TNV - 1 , TNV - 2 or TNV - 3 CIRCUITS .
However, HAZARDOUS - LIVE - PARTS shall be located or guarded so that accidental shorting to TNV CIRCUITS , for example by TOOLS or test probes used by SERVICE PERSONNEL , is unlikely. Any guards required for ompliance with 4.2.2.1 shall be easily removable and replaceable if removal is necessary for service. Test Finger Probe
Compliance is checked by inspection, by measurement and by means of the test finger (IEC 61032, test probe B) applied as specified in the compliance section of the relevant equipment standard), and the test probe, figure 3.

Standard:IEC 62368-1:2018 clause 5.3.2 and Figure V.3, IEC60950 figure 2C, IEC60065:2014 Annex B, Test Probe. According IEC 62151 Figure 3 and UL6500 figure B.1.

Application:It is used for the bare parts of TNV circuits of information technology equipment to see whether they have sufficient protection.

Test sample:Information technology equipment.

Feature:Nylon handle + stainless steel probe.

Parameters:

Model HT-I23
Probe length 80
End radius R6
Probe diameter Φ12
Baffle diameter of the handle 50

Picture for reference:

IEC 62368-1 Figure V.3 Test Finger Probe Telecom Test Probe With IEC60950 Figure 2C


Product Tags:

Figure V.3 Test Finger Probe

      

IEC 62368-1 Test Finger Probe

      

IEC 60950 Telecom Test Probe

      
 IEC 62368-1 Figure V.3 Test Finger Probe Telecom Test Probe With IEC60950 Figure 2C Manufactures

IEC 62368-1 Figure V.3 Test Finger Probe Telecom Test Probe With IEC60950 Figure 2C Images

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